The Advanced Microscopy Facility

Welcome to the Advanced Microscopy Facility (AMF), an open user facility located in the Bob Wright Centre at the University of Victoria in beautiful British Columbia.

 
Silicon solar cell

Silicon solar cell: Top view and FIB section of an ordered structured amorphous Silicon solar cell, made by nanosphere lithography and PECVD. Manufacture, SEM imaging, and FIB section by Milton Wang of the Brolo lab.

 

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STEHM update

Last updated: 01:42 PM, Tuesday, January 21st, 2014

The STEHM is ready in its high-resolution imaging and diffraction mode at 300 kV, 200 kV and 60 kV. The 300 kV works with thick specimens and produces the highest spatial resolution imaging. The 60 kV mode is good for beam sensitive specimens and provides more contrast, while achieving sub-Angstrom spatial resolution.

Training for use of the STEHM will be on an individual basis, first come, first served. Please contact our laboratory manager Dr. Elaine Humphrey, and fill out the training application form.

With regards to preparing your specimens, please see Dr. Elaine Humphrey, Adam Schuetze or Dr. Rodney Herring for help before beginning your preparation. TEM substrates for your specimens such as Silicon Nitride and holey Carbon are available to purchase from the laboratory for this purpose. Please do not use Formvar coated grids, they will not be allowed into the STEHM. We also have many types of specimen preparation solutions especially required for biological and beam-sensitive specimens.

The Hitachi FB-2100 FIB and Fischione 1010 Ion Mill are available for fabricating your specimens. A Fishione 1020 Plasma Cleaner and two Hitachi Zone (UV) cleaners are available for cleaning your specimens. A Gatan Cryoplunge 3 flash freezer is being installed at the beginning of November to keep liquids in an amorphous state in specimens containing water or other forms of liquids. Special TEM specimen containers for liquids and gases will be available and are expected to arrive for use in the near future.

The specimen holders available include a single tilt holder, double tilt holder and heating holder (up to 1500 C). Our cold stage LN2 holder and tomography holder are expected to arrive in December 2013.

For Analytical Electron Microscopy, i.e., determining compositions and the state of atoms and ions in materials, the Electron Energy Loss Spectrometer is now available. The X-ray Electron Dispersive Spectrometer (EDS) has been repaired and will be re-installed at the beginning of November.

Critical Information

Please review these items before booking your instrument or planning your project.



  • Adam will be away the week of April 21st.
    Posted 9 days ago
  • Just a reminder, the lab is closed Friday April 18 and Monday April 21 for Easter.
    Posted 9 days ago
  • Hitachi S-4800 SEM users will no longer pay an additional fee to use EDS, as of April 1st. See http://t.co/44xClI4ICg
    Posted 20 days ago
  • Hitachi S-4800 SEM user fees have increased for inside and academic users as of April 1st. See http://t.co/ZXK9HQM45L
    Posted 20 days ago
  • When booking the FIB, please use the earliest available time slot, to maximize instrument utility.
    Posted 1 month ago
  • If you are using the instruments during regular business hours, we require you to book the instrument online before beginning work.
    Posted 1 month ago
  • When booking the plasma cleaner in the "supplies" section of the booking system, please use the "comment" field to record the tank pressure.
    Posted 1 month ago
  • Want to book sessions past 4:45 PM? Contact Adam about becoming approved for after hours access.
    Posted 3 months ago
  • Want to get trained on the STEHM? Fill out the application form, and we'll notify you when the next session will be. http://t.co/FBND5ZHPGC
    Posted 6 months ago

Workshop News

See below for the next available workshop and workshop related news.


  • The FIB workshop scheduled for this coming week has been cancelled. The next workshop will be scheduled for May.
    Posted 9 days ago
  • The next SEM workshop is April 28 and 29, from 9:30 AM to 12:30 PM. Apply online: http://t.co/ENbu6HXKho
    Posted 10 days ago
  • Training videos on inserting and removing specimens with Hitachi S-4800 SEM have been posted. http://t.co/ieIudpP3YT
    Posted 4 months ago
  • The fee structure has been posted for SEM EDX training. http://t.co/PsGRc7y4k0
    Posted 4 months ago
  • Want to get trained on the STEHM? Fill out the application form, and we'll notify you when the next session will be. http://t.co/FBND5ZHPGC
    Posted 6 months ago

In The News

When the AMF is featured in the news, you will find it here.


Full Feed

This is the complete feed of every posted item. Click on the icons below for archive of older items.


  • The FIB workshop scheduled for this coming week has been cancelled. The next workshop will be scheduled for May.
    Posted 9 days ago
  • Adam will be away the week of April 21st.
    Posted 9 days ago
  • Just a reminder, the lab is closed Friday April 18 and Monday April 21 for Easter.
    Posted 9 days ago
  • The next SEM workshop is April 28 and 29, from 9:30 AM to 12:30 PM. Apply online: http://t.co/ENbu6HXKho
    Posted 10 days ago
  • The second session of the next FIB workshop has been moved from April 15th to April 16th.
    Posted 11 days ago